Prediction of Censored Weibull Lifetimes in a Simple Step-Stress Plan With Khamis-Higgins Model
Abstract
In this paper, we discuss the prediction of the lifetimes to failure of censored units from Weibull distribution for a simple step-stress plan under Khamis-Higgins model. Different methods of prediction are considered including maximum likelihood predictor, modifified maximum likelihood predictor, conditional median predictor, and best unbiased predictor. Another aspect of prediction is constructing prediction limits for future lifetimes of the censored units. The pivotal quantity, highest conditional density, and shortest-length based methods are discussed in this paper. Monte Carlo simulations are performed to compare all the prediction methods developed here and one real data set is analyzed for illustrative purposes.References
A. A. Alhadeed, and S. S. Yang, Optimal simple step-stress plan for Khamis-Higgins mode, IEEE Transactions on Reliability, vol. 51, no. 2, pp. 212–215, 2002.
M. A. Amleh, and M. Z. Raqab, Inference in simple step-stress accelerated life tests for Type-II censoring Lomax data, Journal of Statistical Theory and Applications, vol. 20, no. 2, pp. 364–379, 2021.
D. S. Bai, and S. M. Kim, Optimum step-stress accelerated life test for Weibull distribution and Type-I censoring, Naval Research Logistics, vol. 40, pp. 193–210, 2006.
N. Balakrishnan, A synthesis of exact inferential results for exponential step-stress models and associated optimal accelerated life-tests, Metrika, vol. 96, pp. 351–396, 2009.
I. Basak, Prediction of times to failure of censored items for a simple step-stress model with regular and progressive Type-I censoring from the exponential distribution, Communications in Statistics-Theory and MethodsI, vol. 43, no. 10-12, pp.2322–2341, 2014.
I. Basak, and N. Balakrishnan, Prediction of censored exponential lifetimes in a simple step-stress model under progressive Type-II censoring, Computational Statistics, vol. 32, no. 4 pp. 1665–1687, 2016.
I. Basak, and N. Balakrishnan, A Note on the prediction of censored exponential lifetimes in a simple step-stress model with Type-II censoring, Calcutta Statistical Association Bulletin, vol. 70, no. 1 pp. 57–73, 2018.
G. Casella, and R. L. Berger, Statistical inference, 2nd edition, Pacific Grove, CA: Duxbury, 2002.
A. Gnguly, D. Kundu, and S. Mitra, Bayesian analysis of a simple step-stress model under Weibull lifetimes, IEEE Transactions on Reliability, vol. 64, no. 1 pp.473–485, 2015.
A.A. Ismail, Optimum partially accelerated life test plans with progressively Type-I interval censored data, Sequential AnalysisDesign Methods and Applications, vol. 34, pp. 135–147, 2015.
A.A. Ismali, Statistical inference for a step-stress partially-accelerated life test model with an adaptive Type-I progressively hybrid censored data from Weibull distribution, Statistical Papers, vol.57, no. 2 pp. 271–301, 2016.
K. S. Kaminsky, and L. S. Rhodin, Maximum likelihood prediction, Annals of the Institute of Statistical Mathematics, vol.37, no. 3 pp. 507–517, 1985.
M. Kateri, and N. Balakrishnan, Inference for a simple step-stress model with Type-II censoring and Weibull distributed lifetime, IEEE Transactions on Reliability, vol.57, pp. 616–626, 2008.
I. H. Khamis, and J. J. Higgins, A new model for step-stress testing, IEEE Transactions on Reliability, vol.47, no. 2 pp. 131–134, 1998.
J. F. Lawless, Statistical models and methods for lifetime data, 2nd edition, John Wiley & Sons, Hoboken, New Jersey, 2003.
X. Liu, Bayesian designing and analysis of simple step-stress accelerated life test with Weibull lifetime distribution, Unpublished thesis, the faculty of the Russ College of Engineering and Technology of Ohio University, USA, 2010.
W. Nelson, Accelerated life testing-step-stress models and data analyses, IEEE Transactions on Reliability, vol. 29, no. 2 pp. 103–108, 1980.
W. Nelson, Accelerated testing: statistical models, test plans, and data analysis. John Wiley & Sons, 1990.
M. Z. Raqab, and H. N. Nagaraja, On some predictors of future order statistics Metron, vol. 53, no. 12 pp.185–204, 1995.
N. M. Seydyakin, On one physical principle in reliability theory, Technical Cybernatics, vol. 3,pp. 80–87, 1966.
- Authors retain copyright and grant the journal right of first publication with the work simultaneously licensed under a Creative Commons Attribution License that allows others to share the work with an acknowledgement of the work's authorship and initial publication in this journal.
- Authors are able to enter into separate, additional contractual arrangements for the non-exclusive distribution of the journal's published version of the work (e.g., post it to an institutional repository or publish it in a book), with an acknowledgement of its initial publication in this journal.
- Authors are permitted and encouraged to post their work online (e.g., in institutional repositories or on their website) prior to and during the submission process, as it can lead to productive exchanges, as well as earlier and greater citation of published work (See The Effect of Open Access).